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International Journal of RF Technologies

International Journal of RF Technologies

Research and Applications
Published in Association with IOS Press

eISSN: 17545749 | ISSN: 17545730

International Journal of RF Technologies: Research & Applications will establish a forum for exchanging information and research results regarding RF technology deployment, data analytics, and business value creation.

For technology deployment, articles should focus on how to deploy the technology to ultimately create business value. Potential technologies that will be covered in the Journal include Radio frequency identification (RFID), Real time location sensing (RTLS), Near-field communication (NFC), and RF-based sensors.

For data analytics, the Journal will publish articles that focus on how and where to capture the data (e.g. real-time, at the device, on the server etc.), present approaches for finding patterns in the data which may reveal process anomalies or areas for improvement, and examine the development and use of software related to RF technologies.

Although grounded on solid scientific backgrounds, the Journal will only publish innovative and challenging papers that have a clear applicability to the business world and are focused on driving business value.

Both original papers and review articles are welcomed. All papers are peer-reviewed.

International Journal of RF Technologies: Research & Applications will establish a forum for exchanging information and research results regarding RF technology deployment, data analytics, and business value creation.

For technology deployment, articles should focus on how to deploy the technology to ultimately create business value. Potential technologies that will be covered in the Journal include Radio frequency identification (RFID), Real time location sensing (RTLS), Near-field communication (NFC), RF-based sensors, RF applications in the IoT, RF applications in Industry 4.0 environments and RF applications in smart buildings.

For data analytics, the journal will publish articles that focus on how and where to capture the data (e.g. real-time, at the device, on the server etc.), present approaches for finding patterns in the data which may reveal process anomalies or areas for improvement, and examine the development and use of software related to RF technologies.

Ultimately, all articles should have a clear link to the creation of business value. Business value is taken in its broadest context as the management, operational or supporting set of linked activities that create value by transforming an input into a more valuable output. It can thus be transferred to different industries or different business functions, including retail, aerospace, automotive, manufacturing, pharmaceutical, public administration and logistics providers, among others.

Although grounded on solid scientific backgrounds, the journal will only publish innovative and challenging papers that have a clear applicability to the business world and are focused on driving business value.

Both original papers and review articles are welcomed. All papers will be peer-reviewed.

Editor-in-Chief
Antonio Rizzi University of Parma, Italy
Associate Editors
Bahar Aliakbarian Michigan State University, USA
Eleonora Bottani University of Parma, Italy
Dursun Delen Oklahoma State University, USA
Bill C. Hardgrave Auburn University, USA
Selwyn Piramuthu University of Florida, USA
Mincong Tang Beijing Jiaotong University, China
Dieter Uckelmann University of Stuttgard, Germany
Editorial Board Members
John Acken Oklahoma State University, USA
John Aloysius University of Arkansas, USA
Massimo Bertolini The University of Modena and Reggio Emilia, Italy
Chin-Ling Chen Chaoyang University of Technology, Taiwan
Angappa Gunasekaran University of Massachusetts Dartmouth, USA
Gaurav Kapoor CSTEP, India
Farhad Moeeni Arkansas State University, USA
Asil Oztekin University of Massachusetts Lowell, USA
Alexander Pflaum Otto-Friedrich University Bamberg, Germany
Frederick Riggins North Dakota State University, USA
Rinaldo Rinaldi University of Florence, Italy
Agusti Solanas Universitat Rovira i Virgili, Spain
Alp Ustundag Istanbul Technical University, Turkey
Ismail Uysal University of South Florida, USA
Giuseppe Vignali University of Parma, Italy
Andrea Volpi University of Parma, Italy
Samuel Fosso Wamba TBS Education, France
Wei Zhou ESCP Europe, France

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