Applied Psychological Measurement
Assessment | Quantitative/Statistical Research (General) | Research Methods in Psychology
For more than thirty years, Applied Psychological Measurement (APM) has led the measurement field in presenting cutting-edge methodologies and related empirical research. Whether the setting is educational, organizational, industrial, social, or clinical, APM focuses on ways to use the most current techniques to address measurement problems in the behavioral and social sciences.
Broad Coverage
Applied Psychological Measurement provides a complete picture of the measurement discipline. Its wide range of features keeps readers informed of all the latest developments that shape this evolving field of study. Among these features are:
- articles reporting the latest empirical research and methodological developments
- brief reports of exploratory, small-sample, or replication studies
- computer program reviews of commercially available software packages used in applied measurement
- book reviews of important new publications
- announcements of statistical and measurement meetings, symposia, and workshops
To view some of the most influential topics covered in APM over the years, please view our "Influential Articles" index located on the journal's home page.
Special Issues
Applied Psychological Measurement regularly supplements its broad scope with special issues, guest edited by leading scholars, devoted to a single topic of emerging importance in measurement. Recent and forthcoming special issues focus on such topics as:
- Polytomous item response theory
- Latest developments in multidimensional item response theory
- Optimal test assembly
Diverse Topics
From discussion of innovative measuring techniques to studies of validity and reliability methods, each issue of Applied Psychological Measurement features the most current explorations of measurement problems and solutions. Some of the important topics frequently covered in APM include item response theory, test equations and linking, reliability theory and methods, differential item functioning, measurement of change, algorithmic test construction, unidimensional and multidimensional scaling, validity methodology, computerized adaptive testing, Rasch models, person fit, and generalizability theory and methods.
International Perspective
Leading authorities in scholarly publication regularly rank Applied Psychological Measurement among the top journals in quantitative psychology. APM is one of the few journals in the field that presents a truly international perspective on measurement, publishing articles contributed by researchers from around the globe. Worldwide respect and renown is further enhanced through a strong partnership with SAGE Publications, an international leader in social and behavioral science publications.
This journal is a member of the Committee on Publication Ethics (COPE).
Submit your manuscript today at https://mc.manuscriptcentral.com/APM.
Applied Psychological Measurement publishes empirical research on the application of techniques of psychological measurement to substantive problems in all areas of psychology and related disciplines.
John Donoghue | Educational Testing Service, USA |
Jimmy de la Torre | University of Hong Kong, Hong Kong |
Brian Habing | University of South Carolina, USA |
Chun Wang | University of Washington, USA |
Yi Zheng | Arizona State University, USA |
Cindy M. Walker | University of Wisconsin - Milwaukee, USA |
Richard M. Luecht | The University of North Carolina - Greensboro, USA |
Niels Waller | University of Minnesota, Twin Cities, USA |
Terry A. Ackerman | The University of North Carolina - Greensboro, USA |
David Andrich | University of Western Australia, Perth, Australia |
Robert L. Brennan | University of Iowa, USA |
David V. Budescu | Fordham University, USA |
Yunxiao Chen | Emory University, USA |
Allan S. Cohen | University of Georgia College of Social Work, USA |
Robert Cudeck | The Ohio State University, USA |
Ying Cui | University of Alberta, Canada |
Fritz Drasgow | University of Illinois at Urbana-Champaign, USA |
Bert F. Green | Johns Hopkins University, USA |
Ronald K. Hambleton | University of Massachusetts, Amherst, USA |
Willem J. Heiser | University of Leiden, Netherlands |
Michelle Liou | Institute of Statistical Science, Academia Sinica |
Adam W. Meade | North Carolina State University, USA |
Eiji Muraki | Tohoku University, Japan |
David Rindskopf | The University of New York, USA |
Klaas Sijtsma | Tilburg University, Netherlands |
Stephen Stark | University of South Florida, USA |
Douglas Steinley | University of Missouri - Columbia, USA |
Hariharan Swaminathan | University of Connecticut, USA |
Yoshio Takane | McGill University, Canada |
Jonathan Templin | University of Kansas, Lawrence, Kansas, USA |
Bo Wang | College Board, USA |
Carol Woods | University of Kansas, USA |
Mark L. Davison | University of Minnesota, Twin Cities, USA |
Mark D. Reckase | Michigan State University, USA |
David J. Weiss | University of Minnesota - Twin Cities, USA |
Manuscript submission guidelines can be accessed on Sage Journals.